Modern digital cameras and cell phones containing digital cameras are merely complex microprocessor systems with ever-increasing amounts of functionality. This increased functionality is spread out ...

Balancing yield and test is essential to semiconductor manufacturing, but it’s becoming harder to determine how much weight to give one versus the other as chips become more specialized for different ...

As chips become more heterogeneous with more integrated functionality, testing them presents increasing challenges — particularly for high-speed system-on-chip (SoC) designs with limited test pin ...

As technology shrinks, Yield and Reliability (YAR) are major challenges of SoC (System on Chip) production. There are many techniques available for increasing YAR. YAR of devices depend on testing ...

Many books cover functional testing techniques, but relatively few also cover technical testing. “The Software Test Engineer’s Handbook, 2nd Edition” (US$49.95, 560 pages) from O’Reilly fills that gap ...