There is considerable ongoing discussion on how to contain exponentially increasing test costs for systems-on-chip (SoCs) and microprocessors. As the transistor geometry shrinks and more transistors ...

Time is money in electronics, as in other industries, and the more time that is invested in testing chips means more costs being added to the product in question. To speed up testing for memory ...

Developing an automated production test solution for current and next-generation complex RF SIP/SOC devices is an increasingly difficult task. Both the test program and the device interface board (DIB ...

SAN FRANCISCO &#151 During the Semicon West trade show, Agilent, Credence and Electroglas separately rolled out automatic test equipment (ATE) solutions to attack chip-testing costs. Electroglas Inc.

With the demand for more functionality at less cost, the RF testing landscape is evolving and morphing into a new frontier. In the cellular space, convergence of services continues to occur at an ...

The following contributed article was provided by Steve Wigley, vice president of product marketing, and Ian Harrison, senior director of applications for LTX Corp., a supplier of automatic test ...

The M5504 also includes integrated device power supplies with precision power sequencing and ramping controls. This makes the M5504 an all-inclusive solution that can perform both AC characterization ...