The eutectic structure of metals and ceramics occurs when multiple solid phases solidify from a liquid phase, forming a three-dimensional (3D) pattern through a self-organizing phenomenon.

Engineers are beginning to appreciate that, from prototypes early in the design cycle through to final system test, a digital pattern generator (DPG) speeds up system debug and therefore shortens the ...

The old adage “time is money” is highly applicable to the production testing of semiconductor devices. Every second that a wafer or chip is under test means that the next part cannot yet be tested.

Both scan automated test pattern generation (ATPG) patterns and IJTAG patterns 1,2,3 are created for a piece of logic that is part of a much larger design. For both, the patterns are independent from ...

Eight New Models Offer Biggest Display Size, Deepest Memory and the Only Pattern Generation Available in a Fixed Configuration PALO ALTO, Calif.—Agilent Technologies Inc. expands its industry-leading ...