IEEE

Efficient Array Pattern Prediction Using a Deep Learning Algorithm

Abstract: In this article, a deep-learning (DL) algorithm is proposed to efficiently predict the pattern of the antenna array. By establishing the Bayesian-optimized convolutional neural network (CNN) ...
IEEE

Deep Reinforcement Learning-Based Automatic Test Pattern Generation

Abstract: Automatic test pattern generation (ATPG) is a key technology in digital circuit testing. In this paper, we propose an ATPG method based on deep reinforcement learning (DRL), aiming to reduce ...